Ground Calibrations and Reference Material F. Masci, 10/30/2008 Below is a list of calibrations we plan to derive from the ground test data. Most of the data is from SDL, some of it from DRS. In summary, the products are to support the Instrumental Calibration pipeline (ICAL), source photometry (WPHOT), pointing reconstruction (PRex) and optical Artifact Identification (ARTID) modules. Some Documents on Detector Characterization Here are some useful documents and papers - mainly focussed towards the detector aspect of the characterization. Other subsystem cognizants may provide more specific information. 1. Amy's paper on where we stand with detector characterization (a must read): http://wisewiki.ipac.caltech.edu/images/a/a5/SPIE_detectors2008.pdf 2. Critical Design Review on Instrumental Calibration: InstruCal_CDRJan08.pdf 3. The following contains a more detailed schematic of the planned processing: ScanPL_instrumental_cal.pdf 4. Overview of MIC2 testing/characterization at SDL: http://wisewiki.ipac.caltech.edu/images/d/d7/MIC2_testing.pdf 5. Summary of recevables from MIC2 testing, schedule and cognizant scientists for each product where available: http://wisewiki.ipac.caltech.edu/images/3/3f/Cal_status.pdf 6. Format specifications for calibration products. Some of the methods and algorithms are based on an old characterization plan from SDL. Therefore, some of the test procedures may have been revised. We encourage you to explore the most optimal algorithm for a specific product GroundCalSpecs.pdf 7. Some thoughts on Droop: Droop_question.pdf 8. Background on focal plane distortion calibration and Code-V modelling: codeVdist.html 9. WISE Digital Electronics Box (DEB) Processing description: http://wise2.ipac.caltech.edu/staff/roc/docs/sdl06-070-.pdf coupled with: WiseErrorModel.pdf 10. To see the big picture, the WSDS Functional Design document: http://wise2.ipac.caltech.edu/staff/roc/docs/WSDS_FDD_v1.pdf 11. For random papers on WISE characterization and similar detectors on (or planned for) other facilities, see files in: caustic:/wise/data/docs/adhoc_external/ Products/Characterization from Ground Test Data These are in some loose priority order, or rather, there may be difficulties in making a product if an earlier one (dependency) doesn't exist. The characterization also includes an analysis of the dependence with FPA temperature and time (stability) if the testing included it. It's also important to note that some tests may include a mixture of ancillary data to enable a product to be derived. E.g., test data intended for flats and non-linearity may include data for deriving darks for use in the flat and non-linearity derivation. 1. Optimal amplifier-bias corrections using reference pixels. Different for HgCdTe and Si:As arrays. Algorithm from Teledyne for HgCdTe implemented but not validated. 2. Darks. Need to remake from DRS data. Data also available from SDL. 3. Droop. 4. Non-linearity correction. Includes dynamic range and full ramp characterization, saturation analysis/verification. 5. Responsivity maps (flat-field corrections). Also assess vignetting. 6. Gain and read-noise maps. 7. Static bad pixel masks - derived in conjunction with other analyses. 8. Point Response Functions and their variation across each array. 9. Focal Plane distortion calibration. 10. Latent/persistence characterization. Both bright and dark flavors; temperature and post-anneal dependencies, possible impacts on responsivity. 11. In-band and out-of-band Relative Spectral Responsity (RSR) curves. May be FPA position dependent. 12. Ad-hoc findings, detector idiosyncrasies, e.g., - Inter-Pixel Capacitance (IPC) - artifacts from bright/saturated sources (muxbleed, muxstripe, banding..) - inter-band electronic crosstalk - optical artifacts if data allows: glints, ghosts, stray light, etc..