Specifications for Pre-flight raw test FITS products

Written by F. Masci & T. Conrow, version 1.0, 4/24/2008


Interface Name:     Project Office (JPL) Calibration Test Data Packager /
                    WSDC Test Data Archiver


Type of Interface:  Header content of FITS (ground) raw-test data products 
                    for ingestion into WSDC's test data archive 


Read By:            WSDC Test Data Ingest/Archiver ____________ C. La Gue
                                                                T. Conrow


Written By:         JPL Test Data Packaging Softeware _________ A. Mainzer 
                                                                ?. ????


DESCRIPTION:

A suggested generic header for raw ground test FITS products is below.
Angle brackets indicate information whose literal content depends on actual
generation circumstances, data type and purpose of the test.


   SIMPLE  =                       T / file does conform to FITS standard 
   BITPIX  =                      16 / number of bits per data pixel 
   NAXIS   =                       2 / number of data axes 
   NAXIS1  =                   <int> / length of data axis 1 
   NAXIS2  =                   <int> / length of data axis 2 
   BAND    =                   <int> / WISE band number (1, 2, 3 or 4)
   BUNIT   =              '<string>' / units of image data 
   WGTEMP  =                 <float> / array test temperature in Kelvin
    .
    . 
   <any other pertinent instrument or monitor keywords to be prefixed by WG>
    .
    .
   WGDATE  = '<YYYY-MM-DDThh:mm:ss>' / frame data acquisition date/time 
   WGTESTID=              '<string>' / ID of test and version if repeat  
   COMMENT intent: <cal-type>
   COMMENT intent: <any additional test information/warnings for frame>
   COMMENT by <principal tester's name> at <institute name>


NOTES:

  1. BITPIX = 16 (2-byte integers) is expected maximum, e.g., DEB output
     is unsigned 15 bit integers.

  2. For bands 1, 2 and 3, NAXIS1 = NAXIS2 = 1024. For band 4, 
     NAXIS1 = NAXIS2 = 512.

  3. BUNIT values: for outut from DEB, BUNIT = 'DEB units', for direct
     SUR outputs (with one FITS image per ramp sample), BUNIT = 'DN'.
     Single quotation marks must be included with all strings.

  4. The WGDATE keyword specifies the date/time stamp string at which the
     actual test data pertaining to the FITS frame was acquired
     (e.g., '2008-05-14T23:27:06' either local or UTC). If time resolution
     (hh:mm:ss) is not available, we suggest that a frame ID or number in
     the test sequence (preferably related to time) be appended to the
     date portion, e.g., WGDATE = '2008-05-14Tframe135'.

  5. The WGTESTID keyword specifies a high level identifier of the test or 
     batch to which the FITS frame belongs (e.g., from some schedule or
     master plan). We suggest that this test ID, version thereof (if
     applicable), and any other classification identifiers, i.e., down to
     the frame number if possible, be concatenated into an underscore
     "_" delimited string. We'll leave it to you to standardize the
     identification scheme for all the ground test products.

  6. The "COMMENT intent: <cal-type>" field gives a brief description
     of the intent or motive of the file. A list of possible cal-types
     (intents) is below. Following this, we encourage additional COMMENT
     lines to be added that summarize any important information or cautionary
     notes for the frame, e.g: "soda was accidentally spilled in dewar", or,
     "MIC temperature unstable". In the end, all log-file information
     (presumably from text files) will be matched to the FITS frames prior
     to archival at the WSDC.

  7. We envisage that each FITS file will correspond to a single image
     plane, and that each file will be uniquely named according to
     its intent or test ID, and any other identifiers/dependencies pertaining
     to the test setup at that instance (e.g., sequential frame number,
     temperature, etc..).


POSSIBLE CAL-TYPES FOR ITEM 6 ABOVE:

   - Point Spread Function

   - Field of View distortion

   - Droop characterization 

   - Latent characterization

   - Optical artifact characterization (glints, ghosts, etc)

   - Non-linearity

   - Gain map

   - Read noise map

   - Responsivity map and vignetting 

   - Darks 

   - Bad pixel characterization

   - Inter-Pixel Capacitance 

   - Bright source detector/electronic artifacts (muxbleed, muxstripe, etc)